Simultaneous X-Ray Flourescence and Diffraction
Due to the fact that the CXC records both the position and energy of each incoming X-ray photon, high speed, high resolution X-ray diffraction experiments are possible in transmission as well as in traditional forward scattering modes. At every single point in the image, a full diffraction pattern and fluorescence spectrum can be derived. This is done simultaneously, without monochromatization, stage, scanning or beam focusing, and the measurements take less than one minute to acquire. Owing to the detectors’ capability to record spatially and spectroscopically resolved images, the simultaneous XRD-XRF signal can be separated, resulting in diffraction patterns with no fluorescence background and fluorescence spectra with no diffraction peaks.