• Products & Applications
    • X-Ray Spectroscopy for EDX & XRF
      • SDD Modules
        • Base SDDs
        • Ultra SDDs
        • Large SDDs
        • Racetrack SDDs
        • High-Flux SDDs
        • Multi Cell SDDs
        • Novel Packaging Techniques
      • SDD Systems
        • The XRF Spectrometer for science and lab (XRS)
        • The flexible XRF Spectrometer for industry OEM and lab (XRP)
        • The flexible XRF Spectrometer for high flux applications (XRP-A)
        • The XRF Spectrometer All-in-One (XRS-A)
        • Multichannel SDD Spectrometer for XRF, XRD and EDX
      • SDD Working Principle and Key Features
    • X-Ray Imaging for XRF & XRD
    • Electron Detection for SEM & TEM
      • BSE Detectors
        • Standard BSD Module
        • Advanced BSD Module
          • Single Gain Advanced BSD
          • Switchable Gain Advanced BSD
      • STEM Detectors
        • Standard STEM Detectors
        • Advanced STEM Detectors
      • BSD/ STEM System
        • Main Amplifier
        • Retractable Arm
    • Electron Imaging for TEM
  • PNFab
    • Silicon Sensor Fabrication
    • Packaging & System Integration
  • Company
    • About us
    • Directions to us
    • Jobs
  • News & Events
    • Product News
    • Company News
    • Events
  • Publications & Brochures
    • Publications
    • Brochures
  • Contact
  • English
  • Chinese
  • Home > Products & Applications > Applications > Simultaneous X-Ray Flourescence and Diffraction

    Simultaneous X-Ray Flourescence and Diffraction

    Due to the fact that the CXC records both the position and energy of each incoming X-ray photon, high speed, high resolution X-ray diffraction experiments are possible in transmission as well as in traditional forward scattering modes. At every single point in the image, a full diffraction pattern and fluorescence spectrum can be derived. This is done simultaneously, without monochromatization, stage, scanning or beam focusing, and the measurements take less than one minute to acquire. Owing to the detectors’ capability to record spatially and spectroscopically resolved images, the simultaneous XRD-XRF signal can be separated, resulting in diffraction patterns with no fluorescence background and fluorescence spectra with no diffraction peaks.

    Request Datasheet







    • © 2014 – 2023 PNDetector
    • Impressum
    • Privacy Policy
    • Datenschutzerklärung