PNDetector is an established manufacturer of high performance radiation detectors for microanalysis, quality assurance and material science. The company was founded 2007 and is situated in Munich, on the Siemens Technology Campus.
Our facilities comprise our own silicon sensor fabrication line as well as a packaging and qualification area. Our talented teams consist of specialists in simulation and design, electronics, mechanics and semiconductor technology. All our tools are state-of-the art.
PNDetector's focus is on standard and advanced detectors for X-ray and electron spectroscopy and imaging, such as p-i-n diodes, Silicon Drift Detectors (SDDs) and pnCCDs.
Ever since founded in 2007, PNDetector is committed to fabricate silicon sensors of highest quality for the detection of electrons and X-rays. Our key technology is an ultra-pure processing of sensor chips enabling us to develop and manufacture innovative advanced silicon radiation detectors for X-ray fluorescence or microanalysis, materials science and quality assurance.
For more than a decade, our products have been and are at the forefront of X-Ray spectroscopy.
Our fabrication facilities comprise a class 1 cleanroom equipped with state-of-the-art customized machines dedicated to the ultra-clean double-sided processing of silicon. The production chain starts with the raw material and ends with the finalized product, packaged and qualified detector modules, systems or sub-systems.
From the development, design and fabrication, to the packaging and assembling of detectors and detector systems, up to system integration and testing: We accurately handle the production process in-house and offer both serial production, as well as solutions tailored to our customer’s needs. We sell our products world-wide to OEM customers.
Fields of Application & Product Range
PNDetector’s Silicon Drift Detectors (SDDs) combine excellent energy resolution and short processing times. Besides single chip configurations, we build monolithic multi-element and large area SDDs, including unique geometries with maximum solid angle. The SDDs are used in a broad range of instruments, such as the Scanning Electron Microscope (SEM), Transmission Electron Microscopy (TEM) and X-ray Fluorescence Devices (XRF and TXRF). Based on our SDDs we offer a variety of industrial and customized XRF System solutions.
In Electron Detection PNDetector’s Backscattered Electron Detectors (BSE) and Scanning Transmission Electron Microscopy (STEM) Detectors enable high speed imaging up to HD TV-speed with very low noise characteristics. The high collection efficiency supports a broad energy range from 1 keV to 300 keV. The electron Detectors are available as a module with integrated preamplifier stage or as a single chip on substrate.
The Color X-ray Camera (CXC), PNDetector’s high resolution spectroscopic X-ray imaging system based on an energy dispersive pnCCD detector, can be deployed in a broad range of imaging instruments in X-ray Fluorescence, X-ray Diffraction, Small Angle X-ray Scattering and Computer Tomography. Key benefits are a high dynamic range and an outstanding signal-to-noise ratio, as well as long-term stability and high radiation hardness.
PNDetector’s compact pnCCD (S)TEM camera system provides fast imaging in (S)TEM applications: It allows single primary electron detection from 20 keV to 300 keV due to its ultra-fast and direct electron detection and its outstanding signal-to-noise ratio. With its high readout speed, and the flexibility of various operation modes, it opens up new scientific and analytical possibilities in electron microscopy, such as 4D-STEM imaging. Due to the high sensitivity, the camera is also suitable for low dose TEM imaging, while at the same time, the detector can collect images at standard electron beam currents without being damaged.