STEM Detectors
Electron Detectors for Scaning Transmission Electron Microscopy (STEM) in SEM and TEM
Scanning Transmission Electron Microscopy (STEM) is a popular technique with growing interest that is applied to a broad variety of specimens in SEM as well as in TEM. Electrons are detected after they have been transmitted through the sample at angles below the incident beam convergence angle (bright field, BF) and electrons with high (annular dark field, ADF) or very high scattering angles (high angle annular dark field, HAADF).
PNDetector’s annular STEM detectors are based on fully depleted p-i-n diodes with a thickness of 400 μm. This minimizes the signal capacitance to values of only several pF, which is mandatory for achieving high detector speeds and low noise levels.
Key Features
• Optimized geometry containing different ring structures and segmentations
• Enabling high quality Differential Phase Contrast (DPC) measurements
• Full sensitivity over a range of 5 keV – 300 keV
• Available in two versions containing central hole and bright field
• High signal intensities and best signal to noise ratios
Find chip configuration here.
Selection of PND Standard STEM Detectors
Selection of PND Advanced STEM Detectors
Differential Phase Contrast (DPC) color map of a 35 nm thin Cobalt sample taken by PNDetector’s STD-STEM-22-4-3-BF15 detector. Scan speed: 80 kHz (12,8 µs) [Courtesy of University of Regensburg, Prof. Dr. Zweck]
FIB-Lamella of Magnesium flakes with embedded SiC nanoparticles (10-200 nm) Low difference in mean atomic numbers: Mg: Z = 12 | MgO : Z= 10 | SiC : Z = 10 Taken by PNDetector’s STD-STEM-22-4-3-BF15 detector Scan speed: 4.5 MHz (220 ns) [Courtesy of ZELMI (TU Berlin), Sören Selve]
Standard STEM Detectors
PNDetector’s Standard STEM Detectors with different chip geometries are all available with Aluminium housing.
Advanced STEM Detectors
The latest STEM Detector with integrated 4-, 9- or 13-Channel Preamplifier is available.