Multi Cell SDDs

The Unique Rococo Detector - a monolithic annular 4-channel SDD for XRF and EDX

When extreme solid angles are needed to detect the most available signal, the Rococo2 and Rococo3 detectors are the best choice you can make.
Due to their special geometry, these monolithic annular 4-channel SDDs with the exciting beam through the hole in the middle of the chip can be placed extremely close to the sample, resulting in huge solid angle values up to 1.8 sr, and in a tremendous reduction of measurement time. At the same time, the annular detector geometry makes possible a 3D-visualisation of the sample without any shadowing effects.

Annular SDDs with a Huge Solid Angle

Huge solid angles up to 1.8 sr
Energy resolution down to 125 eV @ Mn-Kα
High count rate capability up to 4 Mcps (ICR)
Fast analysis of sensitive samples in XRF-systems and synchrotron applications
SEM-EDX analysis with highest sensitivity

Solid angle plotted against the distance between sample and detector chip for both Rococo2 and Rococo3

Energy Resolution as a function of processing time for both Rococo2 and Rococo3

Spectrum of a sample composed of various elements measured with a Rococo2

Energy resolution versus processing time measured with all 4 channels of Rococo1 detector at -25°C chip temperature

ROCOCO Preamplifier Module

Rococo1 detector module

Particulary advantageous in SEM-EDX

EDX mappings with high-quality statistics can be performed in seconds
Many times more signal compared to measurements with conventional SDDs
Unmatched sensitivity up to 1 kcps / pA primary beam current

Light-element sensitivity down to Beryllium
No shading by sample topography

EDX measurement setup using a standard detector (left) and a Rococo2 (right). Note the difference in solid angle (red).

Rococo3 shows a significantly higher output count rate than the SD3 module at the same electron beam currents.

A high resolution SEM-EDX mapping of tin on carbon. There is no shading between the spheres

EDX mapping of a duplex brass sample with alpha and beta phases

Fast XRF elemental mapping

High collection efficiency leading to substantial reduction of the measurement time
Light-proof version for light sensitive experiments (e.g. involving a light microscope)
Fast analysis of biological samples at synchrotron nano-beam lines
Increased sensitivity for trace element analysis in PIXE experiments

XRF mapping of inlaid work of a Lombard buckle from the seventh century found in Tezzo d'Adda (northern Italy) (A. Longoni et al., X-Ray Spectrom. 2005, 34: 439-445)

Single element maps obtained from HeLa cells with a Rococo2 XRF System plus corresponding light microscopic image (C. Rumancev et al. (2020). J. Synchrotron Rad. (2020) 27: 60-66)