Electron ptychography is a 4D-STEM technique that was described theoretically in 1993 but so far was limited experimentally by the low readout speed of existing cameras. In this technique, the intensity distribution in the bright field disk is recorded in 2D for each STEM probe position. In an electron waveoptical approach, the phase and amplitude information is extracted from the re-corded intensity images. The reconstructed phase image shows enhanced image contrast compared to the conventional annular dark field image.