用于 SEM 和 TEM 的电子探测
Backscattered Electron (BSE) and Scanning Transmission Electron Microscope (STEM) Detectors - The best for your application
Based on our decades of experience in SDD production, we are able to provide state of the art silicon-based p-i-n diodes for electron detection in SEM and STEM applications. We are pushing the limits with our in-house Silicon fabrication line for all of our BSE and STEM detectors with an unmatched level of quality and flexibility to be capable of reacting fast to the demand of the market.
BSE Detectors (BSD) with different sizes and geometries are available. Geometric collection efficiencies up to 65% can be achieved, leading to 2 - 3 times larger signals compared to many other commercial BSE diodes.
Several rings on one monolithic sensor allow compact and efficient wide range detectors reaching from BF over ADF, LAADF up to HAADF. The rings are divided into quadrants, enabling differential phase contrast measurement techniques.
The BSD/STEM System is the best choice for fully integrated setups. It is a combination of the detector, main amplifier and the retractable arm to be easily installed in the SEM/TEM chamber.