用于 EDX 和 XRF 的 X 射线光谱仪
SDDs for EDX and XRF
High resolution, high throughput EDX spectroscopy in electron microscopy and XRF analysis require detectors with low input capacitance, providing optimum performance at short processing times. At the same time they must provide large solid angles for collecting the incoming photons while fitting to challenging spatial restrictions.
PNDetector's Silicon Drift Detectors (SDD) show superior performance in all these criteria.
The SDD comes as a packaged module solution built into transistor outline (TO) packages with closed or open caps. The SDD chip is cooled down to temperatures of -20˚C to -30˚C by integrated Peltier coolers. At these temperatures the optimum detector performance is reached.
Our SDD Systems are designed for an easy operation of the SDD Modules. Each PNDetector SDD System comprises a preamplifier, thermal interface to a heat sink, a power supply and the read out of the output signals and housekeeping data.