用于 EDX 和 XRF 的 X 射线光谱仪
SDDs for EDX and XRF
High resolution, high throughput EDX spectroscopy in electron microscopy and XRF analysis require detectors with low input capacitance, providing optimum performance at short processing times. At the same time they must provide large solid angles for collecting the incoming photons while fitting to challenging spatial restrictions.
PNDetector's Silicon Drift Detectors (SDD) show superior performance in all these criteria.
The working principle of the Silicon Drift Detector (SDD) is based on the concept of sideward depletion.