Information like crystal structure and phases, lattice defects, or strain along interfaces can be determined by 2D diffraction pattern analysis. Recording the 2D diffraction pattern for each probe position with the pnCCD (S)TEM camera allows any pattern region or diffraction peak to be analysed from the raw data without loosing the conventional, well-established STEM view. The examples below show two possibilities to exploit this feature. For the first example, a selective area diffraction (SAD) analysis was done by selecting single diffraction discs to generate multiple synthetic STEM images.