Simultaneous XRF-XRD Mapping
Chemical and structural maps from a single measurement.
Also known as: combined XRF/XRD mapping (XRF-XRF), simultaneous XRD–XRF mapping, dual-modality XRF–XRD mapping.
In many XRF mapping experiments, diffraction and elastic scattering are unintentionally mixed into fluorescence data. With conventional energy-dispersive point detectors, it is difficult or impossible to distinguish whether a spectral feature or a bright spot in a map originates from true elemental fluorescence or from diffraction.
A pnCCD based Colour X-Ray Camera (CXC) records both the energy and the position of every detected photon. This additional spatial information makes it possible to separate fluorescence and diffraction signals, enabling corrected XRF maps and spatially resolved diffraction information to be extracted from the same dataset.
Why diffraction complicates XRF mapping
In real samples, especially crystalline or textured materials, Bragg diffraction and elastic scatter can produce strong, localised signals. In an elemental map, these can appear as bright spots that may be misinterpreted as regions of high elemental concentration.
With a conventional 1D detector, only the photon energy is measured. If diffraction peaks overlap or sit close to fluorescence lines, they cannot be reliably separated.
Key points
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Diffraction can introduce false contrast into XRF maps
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Energy-only detectors cannot distinguish diffraction from fluorescence
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Misinterpretation often only becomes apparent after further analysis
How the CXC separates fluorescence and diffraction
The CXC measures both the energy and the arrival position of individual X-ray photons. This provides two independent ways to distinguish signals.
Fluorescence typically produces a smooth, spatially distributed signal across the detector for a given illuminated spot. Diffraction, by contrast, appears as spatially localised features such as spots, arcs, or rings on the sensor.
By combining spatial and energy filtering, fluorescence and diffraction contributions can be separated during analysis.
Key points
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Fluorescence is spatially homogeneous across the detector
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Diffraction is spatially localised and structured
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Energy and position together enable reliable signal separation
Two complementary maps from one acquisition
Once separated, the same dataset can be used to generate two different but complementary views of the sample.
A corrected XRF map is produced with diffraction contributions removed, improving the reliability of elemental contrast. At the same time, spatially resolved diffraction information can be extracted to form an XRD map, revealing structural or crystallographic variations.
Both maps are intrinsically aligned, as they originate from the same measurement and geometry.
Key points
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Corrected elemental maps with reduced artefacts
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Diffraction maps revealing structural information
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No need for separate measurements or detectors
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No post-hoc correlation between independent datasets
A simpler experimental workflow
Traditionally, combining XRF and XRD requires separate detectors, separate geometries, or even different instruments. This increases experimental complexity and makes spatial correlation between datasets challenging.
With the CXC, both modalities are captured in a single scan using one detector and one geometry. This simplifies setup, reduces alignment effort, and ensures consistent spatial registration.
Key points
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One detector, one geometry
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No need for multiple instruments or reconfiguration
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Intrinsic spatial alignment between XRF and XRD data
Learn more
If you are interested in simultaneous XRF–XRD mapping, or would like to understand how Colour X-Ray Camera (CXC) systems can be used to simplify combined chemical and structural measurements, please contact us to discuss your application.
If you are specifically looking for commercially available systems built on this core technology, explore our range of Colour X-Ray Camera (CXC) products here.