• Products & Applications
    • X-Ray Spectroscopy for EDX & XRF
      • SDD Modules
        • Base SDDs
        • Ultra SDDs
        • Large SDDs
        • Racetrack SDDs
        • High-Flux SDDs
        • Multi Cell SDDs
        • Novel Packaging Techniques
      • SDD Systems
        • The XRF Spectrometer for science and lab (XRS)
        • The flexible XRF Spectrometer for industry OEM and lab (XRP)
        • The flexible XRF Spectrometer for high flux applications (XRP-A)
        • The XRF Spectrometer All-in-One (XRS-A)
        • Multichannel SDD Spectrometer for XRF, XRD and EDX
      • SDD Working Principle and Key Features
    • X-Ray Imaging for XRF & XRD
    • Electron Detection for SEM & TEM
      • BSE Detectors
        • Standard BSD Module
        • Advanced BSD Module
        • Switchable Gain Advanced BSD
      • STEM Detectors
        • Standard STEM Detectors
        • Advanced STEM Detectors
      • BSD System
        • Advanced BSD Module for BSD System
        • Main Amplifier for BSE Detectors in SEM
        • Retractable Arm
        • Digitizing and Scanning System
      • STEM Systems in SEM
        • Advanced STEM Detectors for SEM
        • Main Amplifier for STEM Detectors in SEM
        • Retractable Arm
        • Digitizing and Scanning System
      • STEM Systems in TEM
        • Advanced STEM Detectors for TEM
        • Main Amplifier for STEM Detectors in TEM
        • Pneumatic Retractable Arm
        • Digitizing and Scanning System
      • Application Lab
        • Electron Microscope Laboratory
        • Application "Notes"
    • Electron Imaging for TEM
  • PNFab
    • Silicon Sensor Fabrication
    • Packaging & System Integration
    • Application Laboratories
  • News & Events
    • Product News
    • Company News
    • Events
  • Publications
    • Publications
  • Company
    • Jobs
    • About us
    • Directions to us
  • Contact
  • English
  • Chinese
  • Home > Products & Applications > Applications in TEM > Single Electron Detection

    Single Electron Detection

    Single Electron Detection

    Due to its extremely high signal-to-noise ratio of 300:1 at 80 keV, the pnCCD (S)TEM camera can detect single electrons. Each pattern in image (a) shows the signal of a single primary electron (80 keV). The single electron events can be pro-cessed to receive images with a spatial resolution better than the physical pixel size. This proces-sing, which is called subpixel imaging, is based on advanced center of gravity methods. It works by taking into account the track and the distribution of the signal electrons in the detector that have been created by the primary electron. The example (b) below shows an electron hologram before (top) and after sub-pixel processing (bot-tom). Comparing the line proles (red and blue curves in the graph underneath) demonstrates the improved resolution of the interference pattern.

    Request Datasheet







    • © 2007 – 2025 PNDetector
    • Impressum
    • Privacy Policy
    • Datenschutzerklärung