Thank you for visiting our booth during the M&M 2026

Thank you to everyone who visited PNDetector at M&M 2026, joined one of our presentations, or simply stopped by for a technical discussion. Across the week, we spoke about everything from fast electron imaging and detector geometry to 4D-STEM, elemental analysis, X-ray detection and instrument integration. These conversations are an important part of M&M for us: understanding the measurement challenges researchers and instrument developers are working on, and discussing where detector technology can help. Thank you also to the Microscopy Society of America, the Microanalysis Society and everyone involved in organising M&M 2026. If we spoke in Milwaukee and there is a topic you would like to continue, we look forward to picking up the conversation.